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Last update: April 12, 2018

 

 

1)             H. Kagitani, S. Kinoshita, O. Kubo, K. Takahashi, H. Tabata, M. Katayama:
gStructural Analysis of Self-Assembled Platinum-Silicide Nanostructures on Si(001) Using Ion Scattering Spectroscopyh,
e-Journal of Surface Science and Nanotechnology 16, 66-71.

2)             S. Osaka, O Kubo, K. Takahashi, M. Oda, K. Kaneko, H. Tabata, S. Fujita and M. Katayama:
gUnpredicted Surface Termination of ƒ¿-Fe2O3(0001) Film Grown by Mist Chemical Vapor Depositionh,
Surf. Sci. 660, 9-15 (2017).

3)             D. Tamba, O. Kubo, M. Oda, S. Osaka, K. Takahashi, H. Tabata, K. Kaneko, S. Fujita and M. Katayama:
gSurface Termination Structure ofƒ¿-Ga2O3 Film Grown by Mist Chemical Vapor Depositionh
Appl. Phys. Lett. 108, Issue 25, 251602 1-5 (2016).

4)             S. Okasaka, O. Kubo, D. Tamba, T. Ohashi, H. Tabata and M. Katayama:
gSurface Structure Analysis of BaSi2(100) Epitaxial Film Grown on Si(111) Using CAICISSh
Surf. Sci. 635, 115-122 (2015).

5)             H. Suto, K. Imai, S. Fujii, S. Honda and M. Katayama:
gGrowth Process and Surface Structure of MnSi on Si(111)h
Surf. Sci. 603, 226-231 (2009)
.

6)             H. Suto, S. Fujii, F. Kawamura, M. Yoshimura, Y. Kitaoka, Y. Mori, S. Honda and M. Katayama:
gSurface Characterization of GaN(0001) Grown by Liquid Phase Epitaxy Using Coaxial Impact-Collision Ion Scattering Spectroscopyh
Jpn. J. Appl. Phys. 47, No. 9, 7281-7284 (2008).

7)             H. Suto, S. Fujii, N. Miyamae, R. D. Armitage, J. Suda, T. Kimoto, S. Honda and M. Katayama:
gStructure Analysis of ZrB2(0001) Surface Prepared by ex situ HF Treatmenth
Jpn. J. Appl. Phys.
45, Part 2, Letters, No.19, L497-L500 (2006).

8)             S. Fujii, Y. Michishita, N. Miyamae, H. Suto, S. Honda, H. Okado, K. Oura and M. Katayama:
hGrowth Process and Structure of Er/Si(001) Thin Filmh
Thin Solid Films 508, 82-85 (2006).

9)             S. Fujii, Y. Michishita, N. Miyamae, H. Suto, S. Honda, K. Oura and M. Katayama:
gDetermination of Lattice Polarity and Surface Relaxation of ZnO(0001)-Zn Surface by Coaxial Impact-Collision Ion Scattering Spectroscopyh
Jpn. J. Appl. Phys. 44, Part 2, Letters, No.41, L1285-L1288 (2005).

10)          S. Fujii, Y. Michishita, N. Miyamae and K. Oura and M. Katayama:
hDevelopment of Low-Energy Neutral Atom Scattering Spectroscopy Based on CAICISS Operable in Gas Phase Atmosphereh
Nucl. Instrum. & Methods Phys. Res. B 232, 290-294 (2005).

11)          S. Fujii, M. Katayama, Y. Michishita and K. Oura:
hIn Situ Monitoring of Surface Processes in Plasma by Coaxial Impact-Collision Ion Scattering Spectroscopyh
Jpn. J. Appl. Phys. 44, Part 1, No. 4A , 1911-1914 (2005).

12)          R. Tsushima, Y. Michishita, S. Fujii, H. Okado, K. Umezawa, Y. Maeda, Y. Terai, K. Oura and M. Katayama:
hGrowth Process and Structure of Fe/Si(111) Ultrathin Film: Transition from Single-Domain Fe(111)/Si(111) to ƒÀ-FeSi2h

Surf. Sci. 579, 73-79 (2005).

13)          R. Tsushima, M. Katayama, T. Fujino, M. Shindo, T. Okuno and K. Oura:
gTemperature Dependence of Flat Ge/Si(001) Heterostructures as Observed by CAICISSh
Appl. Surf. Sci.216, 19-23 (2003).

14)          T. Fujino, M. Katayama, S. Inoue, A. Tatsumi, T. Horikawa and K. Oura:
hQuantitative Analysis of Hydrogen-Induced Si Segregation on Ge-Covered Si(001) Surfaceh
Jpn. J. Appl. Phys. 42, Part 2, No.5A , L485-L488 (2003).

15)          K. Oura and M. Katayama:
h
Ion Beam as a Probe to Study the Behavior of Hydrogen on Silicon Surfacesh
Current Applied Physics 3, 39-44 (2003).

16)          M. Katayama:
h
Exploring Surface Processes by Coaxial Impact-Collision Ion Scattering Spectroscopy and Time-of-Flight Elastic Recoil Detection Analysish
Current Applied Physics 3, 65-69 (2003).

17)          T. Fujino, M. Katayama, T. Okuno, M. Shindo, R. Tsushima and K. Oura:
g
Thermal Stability in the Morphology of Ge films on Si(001) grown by Hydrogen-Surfactant-Mediated Epitaxyh
Jpn. J. Appl. Phys. 42, Part 2, No. 1AB, L63-L66 (2003).

18)          •ÐŽRŒõ_C“¡–ìr–¾C”ö‰YŒ›Ž¡˜YF
g‹C‘Š•µˆÍ‹C‰º‚Ì•\–ʃvƒƒZƒX‚̃CƒIƒ“ƒr[ƒ€‚»‚̏êŒv‘ª | Ge/Si(001)…‘fƒT[ƒtƒ@ƒNƒ^ƒ“ƒg”}‰îƒGƒsƒ^ƒLƒV[|h
•\–ʉȊw 23, No. 12, 759-766 (2002).

19)          J.-T. Ryu, M. Katayama and K. Oura:
gSn Thin Film Growth on Si(111) Surface Studied by CAICISSh
Surf. Sci. 515, 199-204 (2002).

20)          T. Fujino, M. Katayama, Y. Yamazaki, S. Inoue, T. Okuno and K. Oura:
gInfluence of Hydrogen-Surfactant Coverage on Ge/Si(100) Hetroepitaxyh
Jpn. J. Appl. Phys. 41, Part 2, No. 7A, L790-L793 (2002).

21)          J.-T. Ryu, T. Fujino, M. Katayama, Y.-B. Kim and K. Oura:
gInfluence of Interface Structures on Sn Thin Film Growth on Si(111) Surfaceh
Appl. Surf. Sci. 190, 139-143 (2002).

22)          T. Okuno, T. Fujino, M. Shindo, M. Katayama, K. Oura, S. Sonoda and S. Shimizu:
gInfluence of Mn Incorporation on Molecular Beam Epitaxial Growth of GaMnN Filmh
Jpn. J. Appl. Phys. 41, Part 2, No. 4A, L415 - L417 (2002).

23)          T. Fujino, T. Okuno, M. Katayama and K. Oura:
gHydrogen Segregation and its Detrimental Effect in Epitaxial Growth of Ge on Hydrogen-terminated Si(001)h
Jpn. J. Appl. Phys. 40, Part 2, No.11A, L1173-L1175 (2001).

24)          T. Fujino, M. Katayama, K. Inudzuka, T. Okuno, K. Oura and T. Hirao:
gSurface Hydroxyl Formation on Vacuum-annealed TiO2(110)h
Appl. Phys. Lett. 79, No. 17, 2716-2718 (2001).

25)          M. Katayama, T. Fujino, Y. Yamazaki, S. Inoue, J.-T. Ryu and K. Oura:
gCoaxial Impact-Collision Ion Scattering Spectroscopy and Time-of-flight Elastic Recoil Detection Analysis for In Situ Monitoring of Surface Processes in Gas Phase Atmosphereh
Jpn. J. Appl. Phys. 40, Part 2, No. 6A, L576 - L579 (2001).

26)          T. Fujino, T. Fuse, J.-T. Ryu, K. Inudzuka, Y. Yamazaki, M. Katayama and K. Oura:
gObservation of Hydrogen Adsorption on 6H-SiC(0001) Surfaceh
Appl. Surf. Sci. 169-170, 113-116 (2001).

27)          T. Fujino, M. Katayama, Y. Yamazaki, S. Inoue, J.-T. Ryu and K. Oura:
gIon Scattering and Recoiling Spectroscopy for Real Time Monitoring of Surface Processes in a Gas Phase Atmosphereh
Surf. Rev. Lett. 7, 657-659 (2000).

28)          T. Fujino, T. Fuse, J.-T. Ryu, K. Inudzuka, Y. Yamazaki, M. Katayama and K. Oura:
gStructural Analysis of 6H-SiC(0001)Ö3xÖ3 Reconstructed Surfaceh
Jpn. J. Appl. Phys. 39, Part 1, No. 11, 6410-6412 (2000).

29)          T. Fujino, T. Fuse, J.-T. Ryu, K. Inudzuka, T. Nakano, K. Goto, Y. Yamazaki, M. Katayama and K. Oura:
gGe Thin Film Growth on Si(111) using Hydrogen Surfactanth
Thin Solid Films 369, 25-28 (2000). 

30)          T. Fujino, T. Fuse, J.-T. Ryu, K. Inudzuka, Y. Yamazaki, M. Katayama and K. Oura:
gAdsorption of Atomic Hydrogen on Ag-covered 6H-SiC(0001) Surfaceh
Jpn. J. Appl. Phys. 39, Part 1, No. 7B, 4340-4342 (2000).

31)          •ÐŽRŒõ_F
g
‹C‘Š•µˆÍ‹C‚É‚¨‚¯‚é•\–ʃvƒƒZƒX‚̃CƒIƒ“ƒr[ƒ€‚»‚̏êŒv‘ª–@‚ÌŠJ‘ñh
¶ŽY‹ZpŽ 52, No. 3, 59-62 (2000).

32)          T. Fujino, T. Fuse, E. Tazou, T. Nakano, K. Inudzuka, K. Goto, Y. Yamazaki, M. Katayama and K. Oura:
gIn-situ Monitoring of Hydrogen-surfactant Effect during Ge Growth on Si(001) using Coaxial Impact-Collision Ion Scattering Spectroscopy and Time-of-flight Elastic Detection Analysish
Nucl. Instrum. & Methods Phys. Res. B 161-163, 419-423 (2000).

33)          J.-T. Ryu, O. Kubo, T. Fujino, T. Fuse, T. Harada, K. Kawamoto, M. Katayama, A. A. Saranin, A.V. Zotov and K. Oura:
gAtomic-hydrogen-induced Self-organization of Si(111)Ö3xÖ3-In Surface Phase Studied by CAICISS and STMh
Surf. Sci. 447, 117-125 (2000).

34)          •ÐŽRŒõ_C“¡–ìr–¾C”ö‰YŒ›Ž¡˜YF
g
ƒVƒŠƒRƒ“•\–Ê‚É‚¨‚¯‚鐅‘f‰îÝƒvƒƒZƒX‚̃CƒIƒ“ƒr[ƒ€‚»‚̏êŒv‘ªh
‰ž—p•¨—Šw‰ï”––ŒE•\–Ê•¨—•ª‰È‰ï News Letter, No. 108, 2-8 (2000).

35)          K. Oura, V. G. Lifshits, A. A. Saranin, A. V. Zotov and M. Katayama:
gHydrogen Interaction with Clean and Modified Silicon Surfacesh
Surf. Sci. Rep. 35, 1-69 (1999).

36)          T. Fuse, K. Kawamoto, M. Katayama and K. Oura:
gIn Situ Observation of Ge d-layer in Si(001) using Quasi Medium Energy Ion Scattering Spectroscopyh
Materials Science in Semiconductor Processing 2, 159-164 (1999).

37)          J.-T. Ryu, T. Fuse, O. Kubo, H. Tani, T. Fujino, T. Harada, A. A. Saranin, A. V. Zotov, M. Katayama and K. Oura:
gAdsorption of Atomic Hydrogen on the Si(001)4x3-In Surface Studied by Coaxial Impact Collision Ion Scattering Spectroscopy and Scanning Tunneling Microscopyh
J. Vac. Sci. Technol. B 17, 983-988 (1999).

38)          T. Fuse, T. Fujino, J.-T. Ryu, M. Katayama and K. Oura:
gTotal Cross Section of Electron Stimulated Desorption of Hydrogen from Hydrogen-Terminated Ge/Si(001) as Observed by Time-of-flight Elastic Recoil Detection Analysish
Jpn. J. Appl. Phys. 38, Part 1, No. 5A, 2878-2880 (1999).

39)          T. Fuse, J.-T. Ryu, T. Fujino, K. Inudzuka, M. Katayama and K. Oura:
gAdsorption of H on the Ge/Si(001) Surface as Studied by Time-of-flight Elastic Recoil Detection Analysis and Coaxial Impact Collision Ion Scattering Spectroscopyh
Jpn. J. Appl. Phys. 38, Part 1, No. 3A, 1359-1362 (1999).

40)          M. Watamori, M. Isono, H. Madono, Y. Kawano, K. Sasabe, T. Hirao and K. Oura:
gIon Beam Analysis of PZT Thin Filmsh
Appl. Surf. Sci. 142, 422-427 (1999).

41)          –ì“cŒ¤“ñC–ö³‘öC•ÐŽRŒõ_C”ö‰YŒ›Ž¡˜YF
g
”òsŽžŠÔŒ^’¼Õ“˃CƒIƒ“ŽU—•ªŒõ–@‚É‚æ‚éSi(111)•\–ʏã‚ÌSn”––Œ¬’·‚ÌŠÏŽ@h
^‹ó 42C208-211 (1999).

42)          T. Fuse, T. Fujino, J.-T. Ryu, M. Katayama and K. Oura:
gElectron Stimulated Desorption of Hydrogen from H/Si(001)-1x1 Surface Studied by Time-of-flight Elastic Recoil Detection Analysish
Surf. Sci. 420, 81-86 (1999).

43)          •ÐŽRŒõ_C–ö³‘öC‹v•Û—CA. A. SaraninCA. V. ZotovC”ö‰YŒ›Ž¡˜YF
g‹à‘®^ƒVƒŠƒRƒ“‰ŠúŠE–ʂ̐…‘f—U‹NŽ©ŒÈ‘gD‰»h
•\–ʉȊw19, No. 9, 579-587 (1998).

44)          T. Fuse, K. Kawamoto, T. Shiizaki, E. Tazou, M. Katayama and K. Oura:
gQuasi-Medium Energy Ion Scattering Spectroscopy Observation of a Ge d-doped Layer Fabricated by Hydrogen Mediated Epitaxyh
Jpn. J. Appl. Phys. 37, Part 1, 2625-2628 (1998).

45)          J.-T. Ryu, K. Kui, K. Noda, M. Katayama and K. Oura:
gThe Effect of Hydrogen Termination on In Growth on Si(100) Surfaceh
Surf. Sci. 401, L425-L431 (1998).

46)          T. Fuse, K. Kawamoto, T. Shiizaki, E. Tazou, M. Katayama and K. Oura:
gObservation of Behavior of Ge d-doped layer in Si(001)h
Nucl. Instrum. & Methods Phys. Res. B 136-138, 1080-1085 (1998).

47)          J.-T. Ryu, K. Kui, K. Noda, M. Katayama and K. Oura:
gCAICISS Studies of Atomic-hydrogen-induced Structural Changes of the Sb Terminated Si Surfacesh
Nucl. Instrum. & Methods Phys. Res. B 136-138, 1102-1107 (1998).

48)          F. Shoji, A. Yamada, T. Shiramizu and K. Oura:
gSurface-recoil Processes of Hydrogen on Si (100)-2~1:H and Si (100)-1~1:2H Surfaces Studied by Low-energy He Ion Beamsh
Nucl. Instrum. & Methods Phys. Res. B 135, 366-371 (1998).

49)          T. Fuse, K. Kawamoto, S. Kujime, T. Shiizaki, M. Katayama and K. Oura:
gQuasi-Medium Energy Ion Scattering Spectroscopy Observation of Surface Segregation of Ge d-doped Layer during Si Molecular Beam Epitaxyh
Surf. Sci. 393, L93-L98 (1997).

50)          T. Fuse, K. Kawamoto, T. Shiizaki, M. Katayama and K. Oura:
gQuasi-Medium Energy Ion Scattering Spectroscopy Study of Ge ƒÂ-layer on Si(001)h
Appl. Surf. Sci. 121/122, 218-222 (1997).

51)          J.-T. Ryu, K. Kui, K. Noda, M. Katayama and K. Oura:
gAtomic-hydrogen-induced Structural Change of the Si(100)-(2x1)-Sb Surface Studied by TOF-ICISSh
Appl. Surf. Sci. 121/122, 223-227 (1997).

52)          F. Shoji and K. Oura:
gHydrogen Analysis of Si Surfaces by Low-energy Ionsh
J. Nucl. Mater. 248, 443-447 (1997).

53)          ’ōè‹MŽjC•z£‹ÅŽuC‹vŽŸ•Ä”ɔ́Cì–{´C•ÐŽRŒõ_C”ö‰YŒ›Ž¡˜YF
gSi(001) ‚É‚¨‚¯‚é Ge ƒfƒ‹ƒ^ƒh[ƒv‘w‚Ì‹““®|TOF-LEIS ‚É‚æ‚éŠÏŽ@|h
•\–ʉȊw 18, No. 7, 394-398 (1997).

54)          J.-T. Ryu, K. Kui, K. Noda, M. Katayama and K. Oura:
gAdsorption of Atomic Hydrogen on the Si(100)-(2x1)-Sb Surfaceh
Jpn. J. Appl. Phys. 36, Part 1, 4435-4439 (1997).

55)          M. Watamori, S. Honda, O. Kubo, I. Kanno, T. Hirao, K. Sasabe and K. Oura:
gHigh-energy Ion Beam Analysis of Ferroelectric Thin Filmsh
Appl. Surf. Sci. 117/118, 453-458 (1997).

56)          M. Watamori, Y. Maeda, O. Kubo and K. Oura:
hA New Method for the Detection of Native Oxide on Si with Combined Use of 16O(ƒ¿, ƒ¿)16O Resonance and Channelingh
Appl. Surf. Sci. 113/114, 403-407 (1997).

57)          S. Honda, K. Chihara, M. Watamori and K. Oura:
hDepth Profilimg of Oxygen Concertration of Indium Tin Oxide Fabricated by Bias Sputteringh
Appl. Surf. Sci. 113/114, 408-411 (1997)

58)          J.-T. Ryu, K. Kui, Y. Tanaka, M. Katayama, K. Oura and I. Katayama:
gTOF-ICISS Observation of Pb Growth on the Si(111)-Ö3xÖ3-Ag Surfaceh
Appl. Surf. Sci. 113/114, 393-397 (1997).

59)          J.-T. Ryu, K. Kui, M. Katayama and K. Oura:
g
The Effects of Atomic-Hydrogen on the Morphology of the Initial Stage of Sb Growth on Si(100) Studied by TOF-ICISSh
Proceedings of the Second Topical Meeting on Structural Dynamics of Epitaxy and Quantum Mechanical Approach, Kobe, 91-95 (1997).

60)          M. Watamori, K. Oura, T. Hirao and K. Sasabe:
hBackscattering Analysis of Thin SiO2 Films on Si using 16O(ƒ¿, ƒ¿)16O 3.045 MeV Resonanceh
Nucl. Instrum & Meth. Phys. Res.B 118, 228-232 (1996).

61)          M. Watamori, K. Oura, T. Hirao and K. Sasabe:
hChanneling Analysis of Oxygen in Oxide Materials using 16O(ƒ¿, ƒ¿)16O Resonant Backscatteringh
Nucl. Instrum & Methods Phys. Res. B 118, 233-237 (1996).

62)          Y. Tanaka, H. Morishita, J.-T. Ryu, I. Katayama and K. Oura:
hThe Initial Stage of Pb Thin Film Growth on Si(111) Surface Studied by TOF-ICISSh
Nucl. Instrum.& Methods Phys. Res. B 118, 530-532 (1996).

63)          S. Honda, M. Watamori and K. Oura:
hThe Effects of Oxygen Content on Electrical and Optical Properties of Indium Tin Oxide Films Fabricated by Reactive Sputteringh
Thin Solid Films 281-282, 206-208 (1996).

64)          K. Kawamoto, T. Mori, S. Kujime and K. Oura:
hObservation of the Diffusion of Ag Atoms though an a-Si Layer on Si(111) by Low-energy Ion Scatteringh
Surf. Sci. 363, 156-160 (1996).

65)          Y. Tanaka, H. Morishita, J.-T. Ryu, I. Katayama and K. Oura:
hThin-film Growth-mode Analysis by Low Energy Ion Scatteringh
Surf. Sci. 363, 161-165 (1996).

66)          F. Shoji, A. Yamada and K. Oura:
hInelastic Energy Loss of Recoiled Hydrogen Ions in Low-energy He+, Ne+ and Ar+ Collisions with Hydrogenated Silicon Surfaceh
Nucl. Instrum. & Methods Phys. Res. B 115, 196-199 (1996).

67)          S. Honda, A. Tsujimoto, M. Watamori and K. Oura:
gEffects of Post-Annealing on Oxygen Content of Indium Tin Oxide Films Fabricated by Reactive Sputteringh
Jpn. J. Appl. Phys. 34, Part 2, No. 10B, L1386-L1389 (1995).

68)          K. Kawamoto and K. Oura:
gScattering Process of Low-Energy Ions from Binary Compound Surfaces at 180‹h
Jpn. J. Appl. Phys. 34, Part 1, No. 9A, 4929-4931 (1995).

69)          K. Kawamoto, K. Inari, T. Mori and K. Oura:
gA New Apparatus for Impact Collision Ion Scattering Spectroscopyh
Jpn. J. Appl. Phys. 34, Part 1, No. 9A, 4917-4919 (1995).

70)          M. Watamori, K. Oura and T. Nakamura:
gQuantitative Depth Profiling of Oxygen in Homoepitaxial SrTiO3 Filmsh
J. Vac. Sci. Technol. A 13, 1293-1298 (1995).

71)          S. Honda, A. Tsujimoto, M. Watamori and K. Oura:
gOxygen Content of Indium Tin Oxide Films Fabricated by Reactive Sputteringh
J. Vac. Sci. Technol. A 13, 1100-1103 (1995).

72)          –ȐX“¹•vC”ö‰YŒ›Ž¡˜YF
g‚¸“xRBS‹¤–ÂŽU—–@‚É‚æ‚é”––Œ‚ÌŽ_‘f•ªÍh
•\–ʉȊw 16, No. 6, 391-396 (1995).

73)          ”ö‰YŒ›Ž¡˜YF
g
’e«”½’µŒŸo•ªÍ(ERDA)h
RADIOISOTOPES 44, No. 5, 364-368 (1995).

74)          –ȐX“¹•vC”ö‰YŒ›Ž¡˜YF
g
ƒwƒŠƒEƒ€ƒCƒIƒ“‹¤–ÂŽU—‚É‚æ‚éŽ_‘fŠÜ—L—ʂ̐â‘Ηʑª’èh
‰ž—p•¨— 64, No. 4, 374-375 (1995).

75)          ”ö‰YŒ›Ž¡˜YF
g
”¼“±‘Ì•\–Ê‚É‚¨‚¯‚鐅‘f”}‰îƒGƒsƒ^ƒLƒV[h
‚Ü‚Ä‚è‚  34, No. 2, 115-120, (1995).

76)          M. Watamori, M. Naitoh, H. Morioka, Y. Maeda and K. Oura:
hLow Temperature Adsorption of Hydrogen on Si(111) and (100) Surfaces Studied by Elastic Recoil Detection Analysish
Appl. Surf. Sci. 82/83, 417-421 (1994).

77)          Y. Tanaka, H. Morishita, M. Watamori, K. Oura and I. Katayama:
hStructural Study of SrTiO3(100) Surfaces by Low Energy Ion Scatteringh
Appl. Surf. Sci. 82/83, 528-531 (1994).

78)          M. Watamori, F. Shoji and K. Oura:
gMethodrogy for Accurate Oxygen Distribution Analysis and its Application to YBa2Cu3OX Thin Films using 16O(a,a)16O 3.045 MeV Resonance Reactionh
Jpn. J. Appl. Phys. 33, Part 1, No. 10, 6039-6045 (1994).

79)          S. Honda, A. Tsujimoto, M. Watamori and K. Oura:
gDepth Profilimg of Oxygen Concertration of Indium Tim Oxide Films Fabricated by Reactive Sputteringh
Jpn. J.Appl. Phys. 33, Part 2, No. 9A, L1257-L1260 (1994).

80)          K. Oura, M. Naitoh, H. Morioka, M. Watamori and F. Shoji:
hElastic Recoil Detection Analysis of Coadsorption of Hydrogen and Deuterium on Clean Si Surfacesh
Nucl. Instrum.& Methods Phys. Res. B 85, 344-346 (1994).

81)          K. Oura, Y. Tanaka, H. Morishita and F. Shoji:
hLow Energy Ion Scattering Study of Hydrogen-induced Recordering of Pb Monolayer Films on Si (111) Surfacesh
Nucl. Instrum.& Methods Phys. Res. B 85, 439-442 (1994).

82)          ”ö‰YŒ›Ž¡˜YF
g
‚ƒGƒlƒ‹ƒM[ƒCƒIƒ“ƒr[ƒ€–@h
‰ž—p•¨— 63, No.2, 173-174 (1994).

83)          ”ö‰YŒ›Ž¡˜YCZ—FO“ñC“à“¡³˜HF
g
ƒVƒŠƒRƒ“•\–ʂ̐…‘f•Ï«‚Æ”––ŒŒ`¬‰Šú‰ß’öh
ŒÅ‘Ì•¨— 28, No. 12, 943-949 (1993).

84)          K. Oura, M. Naitoh and F. Shoji:
hIon Beam Analysis of Hydrogen on Silicon Surfacesh
Microbeam Analysis 2, 139-150 (1993).

85)          M. Naitoh, H. Morioka, F. Shoji and K. Oura:
hCoadsorption of Hydrogen and Deuterium on Si(100) Surface Studied by Elastic Recoil Detection Analysish
Surf. Sci. 297, 135-140 (1993).

86)          F. Shoji, K. Kusumura and K. Oura:
hA Si(100)-2~1: H Monohydride Surface Studied by Low-energy Recoil-ion Spectroscopyh
Surf. Sci. 280, L247-L252 (1993).

87)          ¶’n•¶–çC”ö‰YŒ›Ž¡˜YF
gƒCƒIƒ“ƒr[ƒ€’e«”½’µ–@‚É‚æ‚éƒVƒŠƒRƒ“•\–ʐ…‘f‹z’…‚ÌŒ¤‹†h
•\–ʉȊw 14, No. 7, 417-422 (1993).

88)          ”ö‰YŒ›Ž¡˜YF
g•\–ÊŠE–ʍ\‘¢‰ðÍ‚É‚¨‚¯‚éƒCƒIƒ“ŽU—–@‚Ì“Á’¥h
•\–ʉȊw 14, No. 7, 382-384 (1993).

89)          M. Watamori, F. Shoji, Y. Bando, T. Terashima and K. Oura:
gIon Channeling Study of SrTiO3 Substrates and As-Deposited YBa2Cu3Ox Thin Filmsh
Jpn. J. Appl. Phys. 32, Part 1, No. 1A, 42-50 (1993).

90)          M. Naitoh, F. Shoji and K. Oura:
g
Direct Observation of the Growth Process of Ag Thin Film on a Hydrogen-terminated Si(111) Surfaceh
Jpn. J. Appl. Phys. 31, Part 1, No. 12A, 4018-4019 (1992).

91)          ”ö‰YŒ›Ž¡˜YF
gƒCƒIƒ“ƒr[ƒ€‚É‚æ‚é•\–ʐ…‘f‚Ì’è—Ê‚Æ‚»‚Ì•\–ÊŒ¤‹†‚ւ̉ž—ph
•\–ʉȊw 13, No. 6, 344-350 (1992).

92)          F. Shoji and K. Oura:
hLow-energy Reocil Ion Spectroscopy Studies of H on Si(111)-7~7h
Appl. Surf. Sci. 60/61, 166-171 (1992).

93)          T. Kinoshita, Y. Tanaka, K. Sumitomo, F. Shoji, K. Oura and I. Katayama:
hHydrogen-induced Reconstruction of Si(111)-ã3-Ag Surface Studied by TOF-ICISSh
Appl. Surf. Sci. 60/61, 183-189 (1992).

94)          M. Naitoh, H. Ohnishi, Y. Ozaki, F. Shoji and K. Oura:
hHydrogen-induced Reordering of the Si(111)-ã3~ã3-Al Surface Studied by ERDA/LEEDh
Appl. Surf. Sci. 60/61, 190-194 (1992).

95)          Y. Tanaka, T. Kinoshita, K. Sumitomo, F. Shoji, K. Oura and I. Katayama:
hAg Thin Film Growth on Hydrogen-terminated Si(100) Surface Studied by TOF-ICISSh
Appl. Surf. Sci. 60/61, 195-199 (1992).

96)          H. Ohnishi, F. Shoji and K. Oura:
g
Effects of High-energy Ion Irradiation on YBa2Cu3Ox Thin Filmsh
Tech.Report.Osaka-U. 42, 2113, 313-319 (1992).

97)          K. Sumitomo, Y. Tanaka, T. Kinoshita, F. Shoji and K. Oura:
g
Monte Carlo Simulation of Low Energy Ions Scattered from Ag(111) Surfacesh
Tech. Report Osaka-U. 42, 2096, 173-179 (1992).

98)          S. Tanaka, T. Nakamura, M. Liyama, N. Yoshida, S. Takano, F. Shoji and K. Oura:
gLow-energy Ion Scattering Spectroscopy Observations of c-axis-oriented YBa2Cu3O7-x Thin-Films – Effects of In-vacuum Annealingh
Appl. Phys. Lett. 59, No. 27, 3637-3639 (1991).

99)          ”ö‰YŒ›Ž¡˜YF
g
•\–ʐ…‘f‚É‚æ‚éƒwƒeƒƒGƒsƒ^ƒLƒVƒƒƒ‹‰ß’ö‚̐§Œäh
¶ŽY‹ZpŽ 43, No. 4, 42-44 (1991).

100)      K. Oura, K. Sumitomo, T. Kobayashi, T. Kinoshita, Y. Tanaka, F. Shoji and I. Katayama:
hAdsorption of H on Si(111)-ã3~ã3-Ag: Evidence for Ag(111) Agglomerates Formationh
Surf. Sci. 254, L460-L464 (1991).

101)      I. Katayama, T. Hanawa, F. Shoji and K. Oura:
hISS-AES Study of the Initial Growth Stage of Cu Thin Films on Si(111)-7~7h
Appl. Surf. Sci. 48/49, 361-365 (1991).

102)      F. Shoji, A. Ogawa and K. Oura :
hSputter-Deposition by a New Penning-Discharge Source with an Axially Integrated Hot-Cathodeh
Appl. Surf. Sci. 48/49, 373-376 (1991).

103)      K. Sumitomo, T. Kobayashi, F. Shoji, K. Oura and I. Katayama:
gHydrogen-mediated Epitaxy of Ag on Si(111) as Studied by Low-energy Ion Scatteringh
Phys. Rev. Lett. 66, 1193-1196 (1991).

104)      F. Shoji, K. Sumitomo and K. Oura:
g
Initial Stages in the Adsorption of Ga and Ag on a Si(111) Surface Studied by Low-energy Na+-ion Scattering Spectroscopyh
Tech. Report Osaka-U. 41, 2045, 119-124 (1991).

105)      “à“¡³˜HC¶’n•¶–çC”ö‰YŒ›Ž¡˜Y:
g
‚ƒGƒlƒ‹ƒM[ƒCƒIƒ“ERDA‚ÆLEED‚É‚æ‚鐅‘fI’[Si(111)–ʏã‚Ì‹â–Œ¬’·‰ß’ö‚ÌŠÏŽ@h
^‹ó 34, No. 3, 140-142 (12-14) (1991).

106)      –؉º•qGC¬—Ñ’‰ŽiCZ—FO“ñC•ÐŽRˆí—YC¶’n•¶–çC”ö‰YŒ›Ž¡˜Y:
g
TOFŒ^ICISS/ERDA‚É‚æ‚é•\–ʉðÍh
^‹ó 34, No. 3, 136-139 (8-11) (1991).

107)      K. Sumitomo, K. Tanaka, I. Katayama, F. Shoji and K. Oura:
hTOF-ICISS Study of Surface Damage Formed by Ar Ion Bombardment on Si(100)h
Surf. Sci. 242, 90-94 (1991).

108)      M. Naitoh, F. Shoji and K. Oura:
hHydrogen-termination Effects on the Growth of Ag Thin Films on Si(111) Surfacesh
Surf. Sci. 242, 152-156 (1991).

109)      F. Shoji, K. Kashihara, K. Sumitomo and K. Oura:
hLow-energy Reocil-ion Spectroscopy Studies of Hydrogen Adsorption on Si(100)-2~1 Surfacesh
Surf. Sci. 242, 422-427 (1991).

110)      F. Shoji, K. Oura and T. Hanawa:
gA High-energy Ion-scattering Channeling and Low-energy Ion-scattering Apparatus for Surface Analysish
Vacuum 42, 189-194 (1991).

111)      K. Umezawa, F. Shoji, T. Hanawa and K. Oura:
g
Elastic Recoil Detection Analysis of the Concentration and Thermal Release of Hydrogen in a-Si:H Films by the ECR Plasma CVD Methodh
Jpn. J. Appl. Phys. 29, Part 1, 1656-1657 (1990).

112)      K. Oura, M. Naitoh, J. Yamane and F. Shoji:
hHydrogen-induced Reordering of the Si(111)-ã3~ã3-Ag Surfaceh
Surf. Sci. 230, L151-L154 (1990).

113)      F. Shoji, K. Kashihara, T. Hanawa and K. Oura:
hNeutralization and Inelastic Scattering Energy Loss of Low Energy He+ Ions at InP (110) Surfacesh
Nucl. Instrum & Methods Phys. Res. B 47, 1-6 (1990).

114)      M. Watamori, F. Shoji, T. Hanawa and K. Oura:
hHigh-energy Ion Channeling Study of the Atomic Displacement of Si(111) Surfaces Induced by Ag Thin Filmsh
Surf. Sci. 226, 77-88 (1990).

115)      K. Oura, M. Naitoh, F. Shoji, J. Yamane, K. Umezawa and T. Hanawa:
hElastic Recoil Detection Analysis of Hydrogen Adsorbed on Solid Surfacesh
Nucl. Instrum & Methods Phys. Res. B 45, 199-202 (1990).

116)      T. Nakahara, S. Ohkura, F. Shoji, T. Hanawa and K. Oura:
hRBS/channeling Study on the Annealing Behavior of Cu Thin Films on Si(100) and (111) Substratesh
Nucl. Instrum & Methods Phys. Res. B 45, 467-470 (1990).

117)      ”ö‰YŒ›Ž¡˜YF
g
‚ƒGƒlƒ‹ƒM[ƒCƒIƒ“’e«”½’µ—±ŽqŒŸo–@‚É‚æ‚锼“±‘Ì•\–ʂ̐…‘f‚Ì’è—ʁh
‰ž—p•¨— 59, No. 7, 937-943 (1990).

118)      M. Watamori, F. Shoji, H. Itozaki, T. Hanawa and K. Oura:
g
Ion Channeling Study of Epitaxially Grown HoBa2Cu3OX Thin Films on MgO(001)h
Jpn. J. Appl. Phys. 29, Part 1, No. 2, 252-258 (1990).

119)      K. Oura, J. Yamane, K. Umezawa, M. Naitoh, F. Shoji and T. Hanawa:
gHydrogen Adsorption on Si(100)-2x1 Surfaces Studied by Elastic Recoil Detection Analysish
Phys. Rev. B
41, No. 2, 1200-1203 (1990).

120)      F. Shoji, M. Watamori, T. Kuroi, K. Oura and T. Hanawa:
g
A Study of Ag Adsorption on Si(111) Surfaces by a Compct Arrangement of Na+ ISS and LEEDh
J. Phys. D: Appl.Phys. 22, 169-173 (1989).

121)      F. Shoji, K. Kashihara, T. Hanawa and K. Oura:
hSurface Hydrogen Detection by Low Energy 4He+ Ion Scattering Spectroscopyh
Surf. Sci. 220, L719-L725 (1989).

122)      F. Shoji, H.Taniguchi, O. Kusumoto, K. Oura, T. Hanawa, Y. Suzuki and S. Ogawa:
g
PIXE in Determination of Argon Impurity in Ion Beam Sputter-deposited Co-Cr Filmsh
Jpn. J. Appl. Phys. 28, Part 1, No. 3, 545-548 (1989).

123)      M. Watamori, K. Oura, F. Shoji, T. Yotsuya, S. Ogawa and T. Hanawa:
g
High-energy Ion Beam Analysis of YBa2Cu3OX Thin Filmsh
Jpn. J. Appl. Phys. 28, Part 1, No. 3, 346-350 (1989).

124)      K. Oura, H. Ugawa, F. Shoji and T. Hanawa:
hComputer Simulation of the Effect of Disoedered Surface Layers on the Reflection of Phosphorus Ions from Silicon (100) Crystlline Targets in Grazing Incidence Ion Implantationh
Nucl. Instrum. & Methods Phys. Res. B 39, 11-14 (1989).

125)      K. Oura, T. Kojima, F. Shoji and T. Hanawa:
hMonte Carlo Simulation of Channeling Effects in High Energy (MeV) Phosphores Ion Implantation into Crystalline Silicon Targetsh
Nucl. Instrum. & Methods Phys. Res. B 37, 975-978 (1989).

126)      F. Shoji, K. Oura and T. Hanawa:
hHigh-resolution Ion Scattering Spectrometry at Energies Ranging from 200 to 2000 eVh
Nucl. Instrum and Methods Phys. Res. B 36, 23-29 (1988).

127)      K. Sumitomo, K. Tanaka, Y. Izawa, I. Katayama, F. Shoji, K. Oura and T. Hanawa:
hStructural Study of Ag Overlayers Depositrd on a Si(111) Substrate by Impact-Collision Ion-Scattering-spectroscopy with Time-of-flight Detectionh
Appl. Surf. Sci. 41/42, 112-117 (1989).

128)      I. Katayama, F. Shoji, K. Oura and T. Hanawa:
g
Cylindrical Mirror Analyzer (CMA) with an Axially Integrated ISS-AES Gun for Surface Composition Analysish
Jpn. J. Appl .Phys. 27, Part 1, No. 11 A, 2164-2167 (1988).

129)      I. Katayama, K. Oura, F. Shoji and T. Hanawa:
g
Oxygen-enhanced Surface Segregation of Mn in Cu-Mn and Ag-Mn Alloy Films Studied by ISS/AESh
Jpn. J. Appl. Phys. 27, Part 1, No. 10, L1822-1824 (1988).

130)      T. Kuroi, K. Umezawa, J. Yamane, F. Shoji, K. Oura and T. Hanawa:
g
Ion Beam Analysis of the Concertration and Thermal Release of Hydrogen in Silicon Nitride Films Prepared by ECR Plasma CVD Methodh
Jpn. J. Appl. Phys. 27, Part 1, No. 8, 1406-1410 (1988).

131)      K. Oura, H. Ugawa and T. Hanawa:
gComputer Simulation of Reflection of P Ions from Si(100) Crystalline Targets in Grazing Incidence Ion Implantationh
J. Appl. Phys 64, No. 4, 1795-1801 (1988).

132)      F. Shoji, Y. Nakayama, K. Oura T. Hanawa:
hMeasurements of Inelastic Energy Loss in Ion-surface-collisions in the Incident Energy Range 200-1500 eV He+ Si(111) Surfaceh
Nucl. Instrum & Methods Phys. Res. B 33, 420-424 (1988).

133)      K. Umezawa, T. Kuroi, J. Yamane, S. Yano, F. Shoji, K. Oura and T. Hanawa:
hQuantitative Hydrogen Analysis by Simultaneous Detection of 1H (19 F,ƒ¿ƒ¿)16O at 6.46 MeV and D 19 F-ERDAh
Nucl. Instrum & Methods Phys. Res. B 33, 634-637 (1988)

134)      K. Umezawa, J. Yamane, T. Kuroi,F. Shoji, K. Oura and T. Hanawa:
hNuclear Reaction Analysis and Elastic Recoil Detection Analysis of the Retention of Deuterium and Hydrogen Implanted into Si and GaAs Crystalsh
Nucl. Instrum & Methods Phys. Res. B 33, 638-640 (1988).

135)      K. Sumitomo, K. Oura, I. Katayama, F. Shoji and T. Hanawa:
hA TOF-ISS/ERDA Apparatus for Solid Surface Analysish
Nucl. Instrum & Methods Phys. Res. B 33, 871-875 (1988).

136)      M. Watamori, T. Nakahara, K. Oura, F. Shoji and T. Hanawa:
hStructural Change of Si(100) and (111) Surfaces after Ag Deposition Studied by MeV Ion Channelingh
Appl. Surf. Sci. 33/34, 51-57 (1988).

137)      F. Shoji, T. Kuroi, M. Watamori, K. Oura and T. Hanawa:
hCapture of Ag Atoms in Defects Produced by Low-energy Ar+ Ion Bombardment on the Si(111) Surfaceh
Appl. Surf. Sci. 33/34, 58-67 (1988).

138)      I. Katayama, F. Shoji, K. Oura and T. Hanawa:
hAn ISS/AES Study of Surface Segregation of Cu-Mn and Cu-Ag Alloy Films In-situ Deposited onto Low Temperature W Substratesh
Appl. Surf. Sci. 33/34, 129-137 (1987).

139)      F. Shoji, K. Oura and T. Hanawa:
hInelastic Effects in Low Energy He+ Ion Scattering from Solid and Atomic Pb Targetsh
Surf. Sci. 205, L787-L792 (1988).

140)      K. Oura, M. Watamori, F. Shoji and T. Hanawa:
gAtomic Displacements of Si in the Si(111)-(ã3~ã3) R30K-Ag Surface Studied by High-energy Ion Channelingh
Phys. Rev. B
38, No. 14, 10146-10149 (1988).

141)      ”ö‰YŒ›Ž¡˜YF
g
‚ƒGƒlƒ‹ƒM[ƒCƒIƒ“‚É‚æ‚é•\–ʁEŠE–Ê•]‰¿‹Zph
‰»Šw‚ƍH‹Æ 62, No. 6, 221-227 (1988).

142)      I. Katayama, K. Oura, F. Shoji and T. Hanawa:
gEvidence for Solute Segregation on Cu-Mn Alloy Surfaces Studied by Low-energy Ion Scatteringh
Phys. Rev. B
38, No. 3, 2188-2191 (1988).

143)      T. Hanawa, I. Katayama, F. Shoji and K. Oura:
hStudy of Surface Segregation of Simultaneously Evaporated Mn-Ag Alloy Films by means of Ion Scattering Spectroscopy and Auger Electron Spectroscopyh
Thin Solid Films 164, 37-41 (1988).

144)      –ȐX“¹•vC¶’n•¶–çC”ö‰YŒ›Ž¡˜YC”·‹P—Y:F
g
Ar{ƒCƒIƒ“ÕŒ‚‚µ‚½Si(111)•\–ʏã‚ł̏ö’…AgŒ´Žq‚Ì‹““®h
^‹ó 30, No. 11, 865-872 (31-38) (1987).

145)      ”ö‰YŒ›Ž¡˜YF
g
’ᑬƒCƒIƒ“ŽU—–@h
“ú–{Œ‹»Šw‰ïŽ 29, No. 2, 138-141 (1987).

146)      •ÐŽRˆí—YC¶’n•¶–çC”ö‰YŒ›Ž¡˜YC”·‹P—YF
g
CMAŒ^AES‘•’u‚É‚æ‚é’ᑬƒCƒIƒ“ŽU—•ªŒõh
^‹ó 29, No. 5, 446-450 (1986).

147)      M. Saitoh, K. Oura, K. Asano, F. Shoji and T. Hanawa:
hLow Energy Ion Scattering Study of Adsorption and Desorption Processes of Pb on Si (111) Surfacesh
Surf. Sci. 154, 394-416 (1985).

148)      K. Oura, M. Katayama, F. Shoji and T. Hanawa:
gReal-space Determination of Atomic Structure of the Si(111)-Ö3xÖ3 R30‹-Au Surface by Low-energy Alkali-ion Scatteringh
Phys. Rev. Lett. 55, 1486-1489 (1985).

149)      •ÐŽRˆí—YC¶’n•¶–çC”ö‰YŒ›Ž¡˜YC”·‹P—YF
g
ƒCƒIƒ“ŽU—•ªŒõ‚É‚æ‚éŽÀ—p•\–Ê‚ÌŠÏŽ@h
^‹ó 28, No. 5, 267-271 (1985).

150)      K. Oura, F. Shoji and T. Hanawa:
g
Detection of Hydrogen on Solid Surfaces by Low-energy Recoil Ion Spectroscopyh
Jpn. J. Appl. Phys. 23, Part 2, No. 9, L694-L696 (1984).

151)      K. Oura, Y. Yabuuchi, F. Shoji, T. Hanawa and S. Okada:
hLow Energy Ion Scattering Study of Palladium Films on Silicon (111)-7~7 Surfacesh
Nucl. Instrum. & Methods
218, No. 1-3, 253-256 (1983).

152)      Y. Yabuuchi, F. Shoji, K. Oura and T. Hanawa:
hSurface Structure of the Si(111)-5~1-Au Studied by Low-energy Ion Scattering Spectroscopyh
Surf. Sci. 131, L412-L418 (1983).

153)      Y. Yabuuchi, F. Shoji, K. Oura, T. Hanawa, Y. Kishikawa and S. Okada:
g
New Surface Structure of Pd on Si(111) Studied by Low-energy Ion-scattering Spectroscopy and LEED-AESh
Jpn. J. Appl. Phys. 21, Part 2, No. 12, L752-L754 (1982).

154)      ”ö‰YŒ›Ž¡˜YF
g
”¼“±‘́E‹à‘®ŠE–Ê‚É‚¨‚¯‚錴Žq\‘¢h
ŒŽŠ§ƒtƒBƒWƒNƒX 3, No. 9, 574-577 (1982).

155)      K. Oura, S. Okada, Y. Kishikawa and T. Hanawa:
hSurface Structure of Epitaxial Pd2Si Thin Filmsh
Appl. Phys. Lett. 40, No. 2, 138-140 (1982).

156)      Y.Terada, T. Yoshizuka, K. Oura and T. Hanawa:
hA Structure Analysis of Ag-adsorbed Si(111) Surface by LEED/CMTAh
Surf. Sci.114, 65-84 (1982).

157)      M. Saitoh, F. Shoji, K. Oura and T. Hanawa:
hInitial Growth Process and Surface Structure of Ag on Si(111) Studied by Low-energy Ion Scattering Spectroscopy (ISS) and LEED-AESh
Surf. Sci. 112, No. 3, 306-324 (1981).

158)      K. Oura, T. Taminaga and T. Hanawa:
gElectronic Properties and Atomic Arrangement of the Ag/Si(111) Interfaceh
Solid State Communications 37, 523-526 (1981).

159)      S. Okada, Y. Kishikawa, K. Oura and T. Hanawa:
hLEED Observation of the Platinum Induced Superstructures on Si Substratesh
Surf. Sci. 100, L457-L460 (1980).

160)      M. Saitoh, F. Shoji, K. Oura and T. Hanawa:
g
Atomic Arrangement of the Si(111)-ã3xã3-Ag Structure Derived from Low-enerdy Ion-scattering Spectroscopyh
Jpn. J. Appl. Phys. 19, Part 2, No. 7, L421-L424 (1980).

161)      S. Okada, K. Oura, T. Hanawa and K. Satoh:
hA LEED-AES Study of Thin Pd Films on Si(111) and (100) Substratesh
Surf. Sci. 97, 88-100 (1980).

162)      K. Oura and T. Hanawa:
hLEED-AES Study of the Au/Si(100) Systemh
Sur. Sci. 82, 202-214 (1979).

 

 

ŽQl•¶Œ£iCAICISSj

1)             M. Katayama, T. Nakayama, C. F. McConville and M. Aono:
gInfluence of Surfactant Coverage on Epitaxial Growth of Ge on Si(001)h
Phys. Rev. B 54, 8600-8604 (1996).

2)             M. Katayama, T. Nakayama, C. F. McConville and M. Aono:
gSurface and Interface Structural Control using Coaxial Impact-Collision Ion Scattering Spectroscopy (CAICISS)h
Nucl. Instrum. & Methods Phys. Res. B 99, 598-601 (1995).

3)             •ÐŽRŒõ_CÂ–쐳˜aF
h
“¯Ž²Œ^’¼Õ“˃CƒIƒ“ŽU—ƒXƒyƒNƒgƒƒƒgƒŠh
RADIOISOTOPES 44, No. 6, 412-428 (1995).

4)             M. Kawai, Z.-Y. Liu, T. Hanada, M. Katayama, and M. Aono:
gLayer Controlled Growth of Oxide Superconductorsh
Appl. Surf. Sci. 82/83, 487-493 (1994).

5)             M. Katayama, C. F. McConville, M. Kawai and M. Aono:
gNovel Automated Method for Oxide Superconductor Film Growthh
RIKEN Review 2, 25-26 (1993).

6)             •ÐŽRŒõ_C’†ŽR’mMCÂ–쐳˜aF
hCAICISS ‚É‚æ‚é•\–ʍ\‘¢ƒ‚ƒjƒ^[‚Æ‚»‚ê‚É‚æ‚é–Œ¬’·ƒRƒ“ƒgƒ[ƒ‹h
•\–ʉȊw 14, No. 7, 423-428 (1993).

7)             T. Hashizume, M. Katayama, D. Jeon, M. Aono and T. Sakurai:
gThe Absolute Coverage of K on the Si(111)-3x1-K Surfaceh
Jpn. J. Appl. Phys. 32, Part 2, L1263-L1265 (1993).

8)             M. Katayama, B. V. King, R. S. Daley, R. S. Williams, E. Nomura and M. Aono:
gSurface and Interface Structural Analysis by Coaxial Impact-Collision Ion Scattering Spectroscopy (CAICISS)h
Springer Series in Material Science Vol. 17 (Ordering at Surfaces and Interfaces)
edited by A. Yoshimori and H. Watanabe, 67-72 (1992).

9)             Â–쐳˜aC•ÐŽRŒõ_F
h
ƒCƒIƒ“ŽU—•ªŒõ‚É‚æ‚éƒGƒsƒ^ƒNƒV[‚Ì‚»‚̏ê‰ðÍh
“ú–{•¨—Šw‰ï•Òu•\–ʐV•¨Ž¿‚ƃGƒsƒ^ƒNƒV[vi”|•—ŠÙj‘æ12Í, 164-178 (1992).

10)          M. Aono, M. Katayama and E. Nomura:
gExploring Surface Structures by Coaxial Impact-Collision Ion Scattering Spectroscopy (CAICISS)h
Nucl. Instrum. & Methods Phys. Res. B 64, 29-37 (1992).

11)          •ÐŽRŒõ_CÂ–쐳˜aF
h
“¯Ž²Œ^’¼Õ“˃CƒIƒ“ŽU—•ªŒõ–@iCAICISSjh
‰ž—p•¨— 61, No. 2, 171-172 (1992).

12)          •ÐŽRŒõ_C–쑺‰pˆêCÂ–쐳˜aF
h“¯Ž²Œ^’¼Õ“˃CƒIƒ“ŽU—•ªŒõ–@iCAICISSj‚Æ‚»‚̉ž—ph
•\–ʉȊw 12, No. 10, 615-622 (1991).

13)          •ÐŽRŒõ_C–쑺‰pˆêCÂ–쐳˜aF
h
ƒCƒIƒ“ŽU—•ªŒõ‚Æ•\–ʍ\‘¢‚Ì“®“IŠÏŽ@h
ƒZƒ‰ƒ~ƒbƒNƒX 26, No. 6, 525-530 (1991).

14)          M. Katayama, M. Aono, H. Oigawa, Y. Nannichi, H. Sugahara and M. Oshima:
gSurface Structure of InAs(001) Treated with (NH
4)2Sx Solutionh
Jpn. J. Appl. Phys. 30, Part 2, L786-L789 (1991).

15)          M. Katayama, B. V. King, E. Nomura and M. Aono:
gStructure Analysis of the CaF
2/Si(111) Interface in its Initial Stage of Formation by Coaxial Impact-Collision Ion Scattering Spectroscopy (CAICISS)h
Prog. Theore. Phys. Suppl. 106, 315-320 (1991).

16)          M. Katayama, R. S. Williams, M. Kato, E. Nomura and M. Aono:
gStructure Analysis of the Si(111)Ö3xÖ3 R30‹-Ag Surfaceh
Phys. Rev. Lett. 66, 2762-2765 (1991).

17)          I. Kamiya, M. Katayama, E. Nomura and M. Aono:
gSeparation of Scattered Ions and Neutrals in CAICISS with an Acceleration Tubeh
Surf. Sci. 242, 404-409 (1991).

18)          M. Katayama, E. Nomura, H. Soejima, S. Hayashi and M. Aono:
gReal-time Monitoring of Molecular-Beam Epitaxy Processes with Coaxial Impact-Collision Ion Scattering Spectroscopy (CAICISS)h
Nucl. Instrum. & Methods Phys. Res. B 45, 408-411 (1990).

19)          Â–쐳˜aC•ÐŽRŒõ_C_’JŠiC–쑺‰pˆêF
h
”÷¬—̈æ‚Ì‹@”\•]‰¿–@‚Æ‚»‚̉ž—p|V‚µ‚¢’ᑬƒCƒIƒ“ŽU—•ªŒõ–@|h
‰ž—p•¨— 59, No. 3, 336-344 (1990).

20)          Â–쐳˜aC•ÐŽRŒõ_F
h
ƒCƒIƒ“ƒr[ƒ€‚É‚æ‚é•\–ʍ\‘¢‰ðÍh
•\–ʉȊw 10, No. 10, 676-685 (1989).

21)          M. Kato, M. Katayama, T. Chasse and M. Aono:
gChanneling and Backscattering of Low Energy Ionsh
Nucl. Instrum & Methods Phys. Res. B 39, 30-34 (1989).

22)          M. Aono, M. Katayama, E. Nomura, D. Choi, T. Chasse and M. Kato:
gRecent Developments in Low-energy Ion Scattering Spectroscopy (ISS) for Surface Structural Analysish
Nucl. Instrum & Methods Phys. Res. B 37/38, 264-269 (1989).

23)          Â–쐳˜aC•ÐŽRŒõ_F
h
’PŒ´Žq‘w‚ÌŒ´Žq\‘¢h
‰ž—p•¨— 57, No. 11, 1686-1697 (1988).

24)          M. Katayama, E. Nomura, N. Kanekama, H. Soejima and M. Aono:
gCoaxial Impact-Collision Ion Scattering Spectroscopy (CAICISS): A Novel Method for Surface Structure Analysish
Nucl. Instrum. & Methods Phys. Res. B 33, 857-861 (1988).